EO Elektronen-Optik-Service GmbH - Scanning Electron Microscopes

Scanning Electron Microscopes (SEM)
New, Upgraded & Second-Hand Equipment
individually customized equipment
Focused Ion Beam Microscopes
FIB-SEM / PFIB-SEM / Dual Column Systems with GIS, ToF-SIMS, SPM, Nano Manipulators and Analysis Systems
Analysis Systems
EDX, WDX, EBSD, 3D Surface Analysis,
Digital Image Processing and Analysis Systems
Preparation Systems
Sputter Coater, Carbon Coater, EB Carbon Coaters, Plasma Systems, Ion Mills, Polishing Systems, Decontamination Systems
3D Measurement
InfiniteFocus, MeX Software
Magnetic Field Cancelling Systems
for SEM, TEM FIB-SEM & Wafer-Inspection-Systems
Accessories and Spare Parts
from cathodes to sample holders and
noise prevention boxes

Your Partner for the Analytical Scanning Electron Microscopy - TESCAN Scanning Electron Microscopes, Dual Beam FIB SEM - TOPCON SEM - Second Hand Camscan SEM

Analysis SystemsEDX, WDX, EBSD, 3D Surface Analysis,Digital Image Processing and Analysis Systems

Preparation SystemsSputter Coater, Carbon Coater, EB Carbon Coaters, Plasma Systems, Ion Mills, Polishing Systems, Decontamination Systems

3D MeasurementInfiniteFocus, MeX Software

Accessories and Spare Partsfrom cathodes to sample holders andnoise prevention boxes

Analysis Systems
EDX, WDX, EBSD, 3D Surface Analysis,
Digital Image Processing and Analysis Systems

Preparation Systems
Sputter Coater, Carbon Coater, EB Carbon Coaters, Plasma Systems, Ion Mills, Polishing Systems, Decontamination Systems

3D Measurement
InfiniteFocus, MeX Software

Accessories and Spare Parts
from cathodes to sample holders and
noise prevention boxes