MeX turns your SEM into a fully functional 3D measuring device without the requirement of any additional hardware. All commonly used microscopes are supported. It pictures the topography of the specimen surface and enables 3D analysis to be carried out directly from the digital images.
The modular design of the package can be adapted to your needs and enables profile- and roughness measurements, area analysis and even volumetric measurements to be made.
The 3D dataset is calculated fully automatically from stereoscopic images that are obtained by simple tilting of the stage.
In most cases additional topographic measurement devices are not necessary. The ability to make measurements from the images helps to increase the performance of your laboratory and to reduce future investments.
The MeX 3D Software can most comfortably be used in interaction with the SEMs of the TESCAN VEGA Series.
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