The EO Scan SEM is equipped with an overhauled CamScan chamber and a brand new state of the art Tescan electron gun. Key features of the EO SCAN Unique 4-lens electron optical system (up to 30 kV), PC-controlled to easily switch between modes for high resolution imaging, ultra-low magnification, ultra-high depth of focus and optimised analysis Effective automatic functions to control and optimise electron optical parameters, and/or to automate working procedures for fast high-quality results Fast and easy 3D stereo imaging via PC-controlled beam deflection with optional 3D surface modelling and analysis Sophisticated user interface, easy-to-use software for microscope control under MS Windows™ Password-protected, multi-level user accounts Built-in remote operation and remote diagnostic Comprehensive software for image archiving, measurement, processing, and analysis Excellent analytical geometry for EDX, WDX, and EBSD analysis Full range of detectors (i.e. BSE, LVSE, etc.), accessories and options Full integration of analytical systems via TCP/IP remote access     Windows™ is a trademark of the Microsoft Corporation USA and other countries. EO SCAN SEM Specifications Chamber Type XL- Vacuum Type H U   Resolution     High Vaccum Mode 3.0 nm (2.0 for LaB6) 3.0 nm (2.0 for LaB6) Low Vacuum Mode  — 3.5 nm (2.5 for LaB6)   Vacuum     High Vacuum Mode < 9*10-3 Pa < 9*10-3 Pa Low Vacuum Mode  — 3 - 500 Pa (optionally 2000 Pa) Working Modes Resolution, Depth, Field, Wide Field, Rocking Beam Magnification 2.5 to 1.000.000x Detectors Standard SE, Touch Alarm, Probe Current Measruement SE, BSE, Touch Alarm, Probe Current Measruement Detectors Optional TE, EBIC, EBSD, EDX, WDX*, BSE, Chamberscope ... TE, EBIC, EBSD, EDX, WDX*, LVSTD (to 500 Pa), Chamberscope ... Accelerating Voltage 200 V to 30 kV Electron Gun Tungsten Heated Cathode or LaB6 Cathode Probe Current 1 pA to 2 µA Requirements 230 V / 50 Hz or 120 V / 60 Hz, 1300 VA, No Water Cooling