The EO Scan SEM is equipped with an overhauled CamScan chamber and a brand new state of the art Tescan electron gun.     Unique 4-lens electron optical system (up to 30 kV), PC-controlled to easily switch between modes for high resolution imaging, ultra-low magnification, ultra-high depth of focus and optimised analysis   Effective automatic functions to control and optimise electron optical parameters, and/or to automate working procedures for fast high-quality results   Fast and easy 3D stereo imaging via PC-controlled beam deflection with optional 3D surface modelling and analysis   Sophisticated user interface, easy-to-use software for microscope control under MS Windows™   Password-protected, multi-level user accounts   Built-in remote operation and remote diagnostic   Comprehensive software for image archiving, measurement, processing, and analysis   Choice of different chambers and stages (SB-, MM- or XM- types) with excellent analytical geometry for EDX, WDX, and EBSD analysis   Full range of detectors (i.e. BSE, LVSE, etc.), accessories and options   Full integration of analytical systems via TCP/IP remote access   Windows™ is a trademark of the Microsoft Corporation USA and other countries.