Scanning Electron Microscopes (SEM) New, Upgraded & Second-Hand Equipment individually customized equipment Focused Ion Beam Microscopes FIB SEM / Dual Column Systems Analysis Systems EDX, WDX, EBSD, 3D Surface Analysis, Digital Image Processing and Analysis Systems Preparation Systems Sputter Coater, Carbon Coater, Plasma Systems 3D Measurement InfiniteFocus, MeX Software Magnetic Field Cancelling Systems for SEM, TEM FIB-SEM & Wafer-Inspection-Systems Accessories and Spare Parts from cathodes to noise prevention boxes