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| Scanning Electron Microscopes (SEM)
New, Upgraded & Second-Hand Equipment
individually customized equipment |
| Focused Ion Beam Microscopes
FIB-SEM / PFIB-SEM / Dual Column Systems with GIS, ToF-SIMS, SPM, Nano Manipulators and Analysis Systems |
| Analysis Systems
EDX, WDX, EBSD, 3D Surface Analysis,
Digital Image Processing and Analysis Systems |
| Preparation Systems
Sputter Coater, Carbon Coater, EB Carbon Coaters, Plasma Systems, Ion Mills, Polishing Systems, Decontamination Systems |
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| Magnetic Field Cancelling Systems
for SEM, TEM FIB-SEM & Wafer-Inspection-Systems |
| Accessories and Spare Parts
from cathodes to sample holders and
noise prevention boxes |
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