Scanning Electron Microscopes (SEM)
New, Upgraded & Second-Hand Equipment
individually customized equipment

Focused Ion Beam Microscopes
FIB-SEM / PFIB-SEM / Dual Column Systems with GIS, ToF-SIMS, SPM, Nano Manipulators and Analysis Systems

Analysis Systems
EDX, WDX, EBSD, 3D Surface Analysis,
Digital Image Processing and Analysis Systems

Preparation Systems
Sputter Coater, Carbon Coater, EB Carbon Coaters, Plasma Systems, Ion Mills, Polishing Systems, Decontamination Systems

3D Measurement
InfiniteFocus, MeX Software

Magnetic Field Cancelling Systems
for SEM, TEM FIB-SEM & Wafer-Inspection-Systems

Accessories and Spare Parts
from cathodes to sample holders and
noise prevention boxes