Ion Milling and Preparation Systems Ion Beam Workstations single and dual ion beam systems for high-qualitatiy sample preparation,  Ion Beam Slope Cutting and Final Polishing • Gentle Mill™ Systems (for TEM) • SC-1000 DIB-System (for SEM) • Additional Information Micro Preparation high-qualitatiy SEM-, FIB-SEM-, TEM-, XTEM- sample preparation for metallograpy, semiconductor scienes or nanotechnology • MicroPol™ • MicroSaw™ • MicroHeat™ Your Technoorg General Distributor for Germany, Austria and Switzerland