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In Micro- and Nanotechnology is a need for tools that allow to resolve and explore objects in the nanometer range, as well as to process them simultaneously. This is the task of a joint research project with a substantial funding, the development of the “Nanoworkbench”.
Project objective is the expansion of Scanning Electron Microscopes (SEM) and Scanning Ion Microscopes (FIB) to universal workbenches, while they were mainly used for resolving samoles and for removing material on the nanometer-scale up to now. Therefore tools and modules are developed, that allow an easy and secure in situ-handling and preparation of objects in SEM/FIB-SEM systems.
Benefit from our project by letting us develop handling tasks and innovative applications for you. For this purpose the project enables us to prepare investigations for you free of charge. Naturally we need your samples and a precise task definition. From that we develop an adequate proof of concept for you
The development work may include • Sample tests • Specialized applications • Process development (automation, nano-handling) • Reports / application notes
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