Mineralogy Solution   TESCAN TIMA Tescan Integrated Mineral Analyzer is based on a VEGA or MIRA SEM with completely integrated EDX system that performs full spectrum imaging at very fast scan speeds.   The TIMA is a fully automated, high throughput, analytical Scanning Electron Microscope. It is specifically designed for the mining and mineral processing industry but can also be used for other applications.   The TIMA solution will address applications such as Mineral Liberation Analysis, process optimization, remediation, and search for precious metals and rare earths. The TESCAN TIMA SEM measures modal abundance, size-by-size liberation, mineral association, and performs PGM search automatically on multiple samples of grain mounts and thin or polished sections. It is equiped with a double or quad EDX system.   TESCAN’s unique technology is based on a completely integrated EDX system that performs full spectrum imaging at very fast scan speeds. Image analysis in TIMA is performed simultaneously with SEM backscatter electron images and a suite of x-ray images. The level of hardware integration of the SEM and EDX allows for unprecedented acquisition speeds for fully automated data collection, resulting in fast, accurate, repeatable and reliable results.   TIMA Advantages Very fast and fully automated data acquisition process reached via SEM and EDX high level hardware integration System based on customer proven MIRA or VEGA SEM Special VEGA column design significantly extending tungsten filament lifetime Newly designed exchangeable sample holder with integrated fixed BSE / EDX calibration standard and Faraday cup Possibility to modify size of samples according to customer demands Up to 4 integrated EDX detectors for maximum system perfomance New Peltier cooled EDX detector type for thermal stability guarantee Improved approach to data analysis increasing speed and reliability of process Variable dwell time and EDX analysis duration adapting to each part of the sample Software released in two editions Various modules for data analysis Customizable classification rules Custom solution possibilities Favorable price to performance ratio