Particles are imaged by the latest generation of TESCAN YAG scintillation backscattered electron (BSE) detector at a fast imaging rate (100 ns/pxl) and without any compromises in image quality. After one field has been scanned, the electron beam returns to each particle found, and precise EDX elemental analysis is performed. TESCAN TRACE GSR supports the use of either a single high-quality LN2-free EDX detector or dual detectors for higher count rates and reduction of spectrum acquisition time. The detector can be 10 mm² or 30 mm² in area. The TESCAN scan generator is used for specimen analysis. The process is fast and reliable, with very high repeatability and level of confidence. TESCAN TRACE GSR Software The intuitive four-step wizard allows the operator to run single samples or batches of up to twenty samples automatically. Each sample can be searched under individual conditions. An advanced automatic calibration procedure uses the TESCAN integrated beam-current meter and X-ray excitation counts for realtime readjustment of the electron column, BSE detector, and X-ray analysis system. |