Low-Energy Ion Mills for Final Polishing Technoorg’s Gentle Mill "Ion Beam Workstation" series has been designed for final polishing, easy cleaning and improving of samples previously treated in standard high- energy ion mills or FIB columns. Gentle Mill models are recommended to users who want to prepare artifact-free and almost damage-free XTEM, HRTEM or STEM samples of the best possible quality.
The Gentle Mill ion beam workstations operate with an outstanding patented hot-cathode low-energy ion source. The extremely low energy of the ion beam guarantees minimization of surface damage and ion beam induced amorphization. The exceptional construction of the ion source allows high ion beam current densities. All ion gun parameters including accelerating voltage and cathode current are controlled automatically by a digital feedback loop, but they can always be changed manually during the sample preparation procedure. The initial values of the ion source parameters are set either automatically or manually and are continuously displayed on the computer screen. |