VELA Focused Ion Beam W-REM

FIB Specific Features

Unique ion optic column differentially pumped, with 2 ion pumps, for ultra-low ion scattering effect

Motorized aperture changer with ultra-high reproducibility

Beam Blanker and Faraday cup included as a standard

Simultaneous SEM imaging with FIB etching or deposition

FIB control is fully integrated in the SEM software

Powerful toolbox for basic shapes creation with programmable process parameters
 

three different FIB columns available

Ga-ion source
Canion

Ga-ion source
Cobra

Au-ion source
Canion C31X